TNP Model 2424/L/P
Semi-Automatic LCD Probe
Station/Laser Repair Systems
-Determines Device Characteristics
-Measures Leakage Current
-Tests for Opens and Shorts
-Stages up to 20" x 20"
[Specifications] [Options
and Accessories]
[System Overview]
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. It’s powerfully built features allows a number of specific tests required by all LCD/flat panel display manufacturers. The state unit is built on a steady and reliable anti-vibration table.
These tests include: 1) determining device characteristics, such as uniformity; 2) Measuring leakage current in both lines and devices; 3) Testing for opens or shorts in individual cells, as well as line to line shorts.
The computer control is operated under Windows environment. Once the initial test parameters are programmed, the stage moves automatically to the desired location. Thereupon the probes are raised and lowered automatically. Interfaces include RS232 (standard) and IEEE488 (optional)
The Model 2424 also accommodates laser systems to provide for a convenient probing and repair system in one. The combination of both these system offers users a powerful and versatile test system available in LCD Industry today.| Device Stage:
Travel: 16" x 16; Optional: 24" x 24" |
| Microscope/Laser Travel:
Gross: 24" x 24" |
| Dimensions:
Prober: 76"(W) x 75"(D) x 75(H) 1200 lbs |
| Utility:
Power: 115VAC, 15A 50/60Hz |
| Micropositioner:
Manual: X-Y, 1" x 1" |
| Optics:
Mitutoyo FS-60: Standard with 10x Eyepiece, 5x, 10x, and 20x Objectives |
| Accessories:
Dark Box (Recommended) |
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Please Contact TNP for features and prices
Copyright © 1999 TNP Instruments, Inc., California, USA